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Journal Abstract Search

140 related items for PubMed ID: 21806187

  • 1. High speed two-dimensional optical beam position detector.
    Rutten PE.
    Rev Sci Instrum; 2011 Jul; 82(7):073705. PubMed ID: 21806187
    [Abstract] [Full Text] [Related]

  • 2. Measurement of probe displacement to the thermal resolution limit in photonic force microscopy using a miniature quadrant photodetector.
    Pal SB, Haldar A, Roy B, Banerjee A.
    Rev Sci Instrum; 2012 Feb; 83(2):023108. PubMed ID: 22380080
    [Abstract] [Full Text] [Related]

  • 3. Back-focal-plane position detection with extended linear range for photonic force microscopy.
    Martínez IA, Petrov D.
    Appl Opt; 2012 Sep 01; 51(25):5973-7. PubMed ID: 22945141
    [Abstract] [Full Text] [Related]

  • 4. A high frequency sensor for optical beam deflection atomic force microscopy.
    Enning R, Ziegler D, Nievergelt A, Friedlos R, Venkataramani K, Stemmer A.
    Rev Sci Instrum; 2011 Apr 01; 82(4):043705. PubMed ID: 21529011
    [Abstract] [Full Text] [Related]

  • 5. Focusing optics of a parallel beam CCD optical tomography apparatus for 3D radiation gel dosimetry.
    Krstajić N, Doran SJ.
    Phys Med Biol; 2006 Apr 21; 51(8):2055-75. PubMed ID: 16585845
    [Abstract] [Full Text] [Related]

  • 6. A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source.
    Kunz M, Tamura N, Chen K, MacDowell AA, Celestre RS, Church MM, Fakra S, Domning EE, Glossinger JM, Kirschman JL, Morrison GY, Plate DW, Smith BV, Warwick T, Yashchuk VV, Padmore HA, Ustundag E.
    Rev Sci Instrum; 2009 Mar 21; 80(3):035108. PubMed ID: 19334953
    [Abstract] [Full Text] [Related]

  • 7. Three-dimensional high-resolution particle tracking for optical tweezers by forward scattered light.
    Pralle A, Prummer M, Florin EL, Stelzer EH, Hörber JK.
    Microsc Res Tech; 1999 Mar 01; 44(5):378-86. PubMed ID: 10090214
    [Abstract] [Full Text] [Related]

  • 8. Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications.
    Li M, Tang HX, Roukes ML.
    Nat Nanotechnol; 2007 Feb 01; 2(2):114-20. PubMed ID: 18654230
    [Abstract] [Full Text] [Related]

  • 9. Avalanche photodiode based detector for beam emission spectroscopy.
    Dunai D, Zoletnik S, Sárközi J, Field AR.
    Rev Sci Instrum; 2010 Oct 01; 81(10):103503. PubMed ID: 21034087
    [Abstract] [Full Text] [Related]

  • 10. Dependence of silicon position-detector bandwidth on wavelength, power, and bias.
    Huisstede JH, van Rooijen BD, van der Werf KO, Bennink ML, Subramaniam V.
    Opt Lett; 2006 Mar 01; 31(5):610-2. PubMed ID: 16570414
    [Abstract] [Full Text] [Related]

  • 11. Low-noise, high-speed detector development for optical turbulence fluctuation measurements for NSTX.
    Schoenbeck NL, Ellington SD, Fonck RJ, Jaehnig K, McKee GR, Smith D, Uzun-Kaymak IU, Winz G.
    Rev Sci Instrum; 2010 Oct 01; 81(10):10D718. PubMed ID: 21033911
    [Abstract] [Full Text] [Related]

  • 12. Radio-frequency scanning tunnelling microscopy.
    Kemiktarak U, Ndukum T, Schwab KC, Ekinci KL.
    Nature; 2007 Nov 01; 450(7166):85-8. PubMed ID: 17972882
    [Abstract] [Full Text] [Related]

  • 13. High speed photodiodes in standard nanometer scale CMOS technology: a comparative study.
    Nakhkoob B, Ray S, Hella MM.
    Opt Express; 2012 May 07; 20(10):11256-70. PubMed ID: 22565748
    [Abstract] [Full Text] [Related]

  • 14. Intensity influence on Gaussian beam laser based measurements using quadrant photodiodes.
    Panduputra Y, Ng TW, Neild A, Robinson M.
    Appl Opt; 2010 Jul 01; 49(19):3669-75. PubMed ID: 20648132
    [Abstract] [Full Text] [Related]

  • 15. Determination and correction of position detection nonlinearity in single particle tracking and three-dimensional scanning probe microscopy.
    Tischer C, Pralle A, Florin EL.
    Microsc Microanal; 2004 Aug 01; 10(4):425-34. PubMed ID: 15327703
    [Abstract] [Full Text] [Related]

  • 16. Direct measurement of the Goos-Hänchen shift using a scanning quadrant detector and a polarization maintaining fiber.
    Yallapragada VJ, Mulay GL, Rao CN, Ravishankar AP, Achanta VG.
    Rev Sci Instrum; 2016 Oct 01; 87(10):103109. PubMed ID: 27802693
    [Abstract] [Full Text] [Related]

  • 17. X-ray beam-position monitoring in the sub-micrometre and sub-second regime.
    Bunk O, Pfeiffer F, Stampanoni M, Patterson BD, Schulze-Briese C, David C.
    J Synchrotron Radiat; 2005 Nov 01; 12(Pt 6):795-9. PubMed ID: 16239750
    [Abstract] [Full Text] [Related]

  • 18. A curved image-plate detector system for high-resolution synchrotron X-ray diffraction.
    Sarin P, Haggerty RP, Yoon W, Knapp M, Berghaeuser A, Zschack P, Karapetrova E, Yang N, Kriven WM.
    J Synchrotron Radiat; 2009 Mar 01; 16(Pt 2):273-82. PubMed ID: 19240340
    [Abstract] [Full Text] [Related]

  • 19. Wideband phase-locked loop circuit with real-time phase correction for frequency modulation atomic force microscopy.
    Fukuma T, Yoshioka S, Asakawa H.
    Rev Sci Instrum; 2011 Jul 01; 82(7):073707. PubMed ID: 21806189
    [Abstract] [Full Text] [Related]

  • 20. 10-fold detection range increase in quadrant-photodiode position sensing for photonic force microscope.
    Perrone S, Volpe G, Petrov D.
    Rev Sci Instrum; 2008 Oct 01; 79(10):106101. PubMed ID: 19044745
    [Abstract] [Full Text] [Related]

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