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Journal Abstract Search

524 related items for PubMed ID: 22380098

  • 1. Constant tip-surface distance with atomic force microscopy via quality factor feedback.
    Fan L, Potter D, Sulchek T.
    Rev Sci Instrum; 2012 Feb; 83(2):023706. PubMed ID: 22380098
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  • 6. Advanced tip design for liquid phase vibration mode atomic force microscopy.
    Muramatsu H, Yamamoto Y, Shigeno M, Shirakawabe Y, Inoue A, Kim WS, Kim SJ, Chang SM, Kim JM.
    Anal Chim Acta; 2008 Mar 24; 611(2):233-8. PubMed ID: 18328326
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  • 7. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
    Slattery AD, Blanch AJ, Quinton JS, Gibson CT.
    Ultramicroscopy; 2013 Aug 24; 131():46-55. PubMed ID: 23685172
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  • 8. Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.
    Yazdanpanah MM, Hosseini M, Pabba S, Berry SM, Dobrokhotov VV, Safir A, Keynton RS, Cohn RW.
    Langmuir; 2008 Dec 02; 24(23):13753-64. PubMed ID: 18986184
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  • 9. A torsional resonance mode AFM for in-plane tip surface interactions.
    Huang L, Su C.
    Ultramicroscopy; 2004 Aug 02; 100(3-4):277-85. PubMed ID: 15231320
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  • 11. Atomic force microscopy (AFM).
    Trache A, Meininger GA.
    Curr Protoc Microbiol; 2008 Feb 02; Chapter 2():Unit 2C.2. PubMed ID: 18770536
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  • 12. Accurate and precise calibration of AFM cantilever spring constants using laser Doppler vibrometry.
    Gates RS, Pratt JR.
    Nanotechnology; 2012 Sep 21; 23(37):375702. PubMed ID: 22922668
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  • 14. A method for atomic force microscopy cantilever stiffness calibration under heavy fluid loading.
    Kennedy SJ, Cole DG, Clark RL.
    Rev Sci Instrum; 2009 Dec 21; 80(12):125103. PubMed ID: 20059166
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  • 16. Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid.
    Miyazawa K, Izumi H, Watanabe-Nakayama T, Asakawa H, Fukuma T.
    Nanotechnology; 2015 Mar 13; 26(10):105707. PubMed ID: 25697199
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  • 17. Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous force.
    Lin SM.
    Ultramicroscopy; 2007 Mar 13; 107(2-3):245-53. PubMed ID: 16982149
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  • 18. Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt control.
    Fairbairn M, Moheimani SO.
    Rev Sci Instrum; 2013 May 13; 84(5):053706. PubMed ID: 23742557
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  • 19. An atomic force microscope tip designed to measure time-varying nanomechanical forces.
    Sahin O, Magonov S, Su C, Quate CF, Solgaard O.
    Nat Nanotechnol; 2007 Aug 13; 2(8):507-14. PubMed ID: 18654349
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  • 20. Topography imaging with a heated atomic force microscope cantilever in tapping mode.
    Park K, Lee J, Zhang ZM, King WP.
    Rev Sci Instrum; 2007 Apr 13; 78(4):043709. PubMed ID: 17477672
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