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PUBMED FOR HANDHELDS

Journal Abstract Search


484 related items for PubMed ID: 22552118

  • 1. Few electron limit of n-type metal oxide semiconductor single electron transistors.
    Prati E, De Michielis M, Belli M, Cocco S, Fanciulli M, Kotekar-Patil D, Ruoff M, Kern DP, Wharam DA, Verduijn J, Tettamanzi GC, Rogge S, Roche B, Wacquez R, Jehl X, Vinet M, Sanquer M.
    Nanotechnology; 2012 Jun 01; 23(21):215204. PubMed ID: 22552118
    [Abstract] [Full Text] [Related]

  • 2. Channel length scaling of MoS2 MOSFETs.
    Liu H, Neal AT, Ye PD.
    ACS Nano; 2012 Oct 23; 6(10):8563-9. PubMed ID: 22957650
    [Abstract] [Full Text] [Related]

  • 3. Fabrication of poly-silicon nano-wire transistors on plastic substrates.
    Park C, Lee S, Choi M, Kang M, Jung Y, Hwang S, Ahn D, Lee J, Song C.
    J Nanosci Nanotechnol; 2007 Nov 23; 7(11):4150-3. PubMed ID: 18047139
    [Abstract] [Full Text] [Related]

  • 4. Realization of a silicon nanowire vertical surround-gate field-effect transistor.
    Schmidt V, Riel H, Senz S, Karg S, Riess W, Gösele U.
    Small; 2006 Jan 23; 2(1):85-8. PubMed ID: 17193560
    [No Abstract] [Full Text] [Related]

  • 5. Optimized structural designs for stretchable silicon integrated circuits.
    Kim DH, Liu Z, Kim YS, Wu J, Song J, Kim HS, Huang Y, Hwang KC, Zhang Y, Rogers JA.
    Small; 2009 Dec 23; 5(24):2841-7. PubMed ID: 19824002
    [Abstract] [Full Text] [Related]

  • 6. n-Type behavior of graphene supported on Si/SiO(2) substrates.
    Romero HE, Shen N, Joshi P, Gutierrez HR, Tadigadapa SA, Sofo JO, Eklund PC.
    ACS Nano; 2008 Oct 28; 2(10):2037-44. PubMed ID: 19206449
    [Abstract] [Full Text] [Related]

  • 7. Negative differential resistance in carbon nanotube field-effect transistors with patterned gate oxide.
    Rinkiö M, Johansson A, Kotimäki V, Törmä P.
    ACS Nano; 2010 Jun 22; 4(6):3356-62. PubMed ID: 20524681
    [Abstract] [Full Text] [Related]

  • 8. Metal-insulator-silicon-insulator-metal waveguides compatible with standard CMOS technology.
    Kwon MS.
    Opt Express; 2011 Apr 25; 19(9):8379-93. PubMed ID: 21643089
    [Abstract] [Full Text] [Related]

  • 9. CMOS-compatible fabrication of room-temperature single-electron devices.
    Ray V, Subramanian R, Bhadrachalam P, Ma LC, Kim CU, Koh SJ.
    Nat Nanotechnol; 2008 Oct 25; 3(10):603-8. PubMed ID: 18838999
    [Abstract] [Full Text] [Related]

  • 10. Reconfigurable silicon nanowire transistors.
    Heinzig A, Slesazeck S, Kreupl F, Mikolajick T, Weber WM.
    Nano Lett; 2012 Jan 11; 12(1):119-24. PubMed ID: 22111808
    [Abstract] [Full Text] [Related]

  • 11. Three-dimensional etching of silicon for the fabrication of low-dimensional and suspended devices.
    Walavalkar SS, Homyk AP, Henry MD, Scherer A.
    Nanoscale; 2013 Feb 07; 5(3):927-31. PubMed ID: 23292113
    [Abstract] [Full Text] [Related]

  • 12. A novel method for fabricating sub-16 nm footprint T-gate nanoimprint molds.
    Peng C, Liang X, Chou SY.
    Nanotechnology; 2009 May 06; 20(18):185302. PubMed ID: 19420609
    [Abstract] [Full Text] [Related]

  • 13. Enhanced electroluminescence from nanoscale silicon p+ -n junctions made with an anodic aluminum oxide pattern.
    Hong T, Chen T, Ran GZ, Wen J, Li YZ, Dai T, Qin GG.
    Nanotechnology; 2010 Jan 15; 21(2):025301. PubMed ID: 19955614
    [Abstract] [Full Text] [Related]

  • 14. Integrated circuits and logic operations based on single-layer MoS2.
    Radisavljevic B, Whitwick MB, Kis A.
    ACS Nano; 2011 Dec 27; 5(12):9934-8. PubMed ID: 22073905
    [Abstract] [Full Text] [Related]

  • 15. Co-integration of nano-scale vertical- and horizontal-channel metal-oxide-semiconductor field-effect transistors for low power CMOS technology.
    Sun MC, Kim G, Kim SW, Kim HW, Kim H, Lee JH, Shin H, Park BG.
    J Nanosci Nanotechnol; 2012 Jul 27; 12(7):5313-7. PubMed ID: 22966563
    [Abstract] [Full Text] [Related]

  • 16. Fabrication of ultrathin and highly uniform silicon on insulator by numerically controlled plasma chemical vaporization machining.
    Sano Y, Yamamura K, Mimura H, Yamauchi K, Mori Y.
    Rev Sci Instrum; 2007 Aug 27; 78(8):086102. PubMed ID: 17764362
    [Abstract] [Full Text] [Related]

  • 17. Porphyrin-silicon hybrid field-effect transistor with individually addressable top-gate structure.
    Seol ML, Choi SJ, Kim CH, Moon DI, Choi YK.
    ACS Nano; 2012 Jan 24; 6(1):183-9. PubMed ID: 22148941
    [Abstract] [Full Text] [Related]

  • 18. Quantum mechanical device modeling: FinFET having an isolated n+/p+ gate region strapped with poly-silicon.
    Kim HG, Kim JS, Kim YK, Won T.
    J Nanosci Nanotechnol; 2007 Nov 24; 7(11):4135-8. PubMed ID: 18047135
    [Abstract] [Full Text] [Related]

  • 19. Transport characteristics of multichannel transistors made from densely aligned sub-10 nm half-pitch graphene nanoribbons.
    Liang X, Wi S.
    ACS Nano; 2012 Nov 27; 6(11):9700-10. PubMed ID: 23078122
    [Abstract] [Full Text] [Related]

  • 20. Morphological impact of zinc oxide layers on the device performance in thin-film transistors.
    Faber H, Klaumünzer M, Voigt M, Galli D, Vieweg BF, Peukert W, Spiecker E, Halik M.
    Nanoscale; 2011 Mar 27; 3(3):897-9. PubMed ID: 21116548
    [Abstract] [Full Text] [Related]


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