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Journal Abstract Search
484 related items for PubMed ID: 22552118
1. Few electron limit of n-type metal oxide semiconductor single electron transistors. Prati E, De Michielis M, Belli M, Cocco S, Fanciulli M, Kotekar-Patil D, Ruoff M, Kern DP, Wharam DA, Verduijn J, Tettamanzi GC, Rogge S, Roche B, Wacquez R, Jehl X, Vinet M, Sanquer M. Nanotechnology; 2012 Jun 01; 23(21):215204. PubMed ID: 22552118 [Abstract] [Full Text] [Related]
2. Channel length scaling of MoS2 MOSFETs. Liu H, Neal AT, Ye PD. ACS Nano; 2012 Oct 23; 6(10):8563-9. PubMed ID: 22957650 [Abstract] [Full Text] [Related]
3. Fabrication of poly-silicon nano-wire transistors on plastic substrates. Park C, Lee S, Choi M, Kang M, Jung Y, Hwang S, Ahn D, Lee J, Song C. J Nanosci Nanotechnol; 2007 Nov 23; 7(11):4150-3. PubMed ID: 18047139 [Abstract] [Full Text] [Related]
4. Realization of a silicon nanowire vertical surround-gate field-effect transistor. Schmidt V, Riel H, Senz S, Karg S, Riess W, Gösele U. Small; 2006 Jan 23; 2(1):85-8. PubMed ID: 17193560 [No Abstract] [Full Text] [Related]
5. Optimized structural designs for stretchable silicon integrated circuits. Kim DH, Liu Z, Kim YS, Wu J, Song J, Kim HS, Huang Y, Hwang KC, Zhang Y, Rogers JA. Small; 2009 Dec 23; 5(24):2841-7. PubMed ID: 19824002 [Abstract] [Full Text] [Related]
6. n-Type behavior of graphene supported on Si/SiO(2) substrates. Romero HE, Shen N, Joshi P, Gutierrez HR, Tadigadapa SA, Sofo JO, Eklund PC. ACS Nano; 2008 Oct 28; 2(10):2037-44. PubMed ID: 19206449 [Abstract] [Full Text] [Related]
7. Negative differential resistance in carbon nanotube field-effect transistors with patterned gate oxide. Rinkiö M, Johansson A, Kotimäki V, Törmä P. ACS Nano; 2010 Jun 22; 4(6):3356-62. PubMed ID: 20524681 [Abstract] [Full Text] [Related]
11. Three-dimensional etching of silicon for the fabrication of low-dimensional and suspended devices. Walavalkar SS, Homyk AP, Henry MD, Scherer A. Nanoscale; 2013 Feb 07; 5(3):927-31. PubMed ID: 23292113 [Abstract] [Full Text] [Related]
12. A novel method for fabricating sub-16 nm footprint T-gate nanoimprint molds. Peng C, Liang X, Chou SY. Nanotechnology; 2009 May 06; 20(18):185302. PubMed ID: 19420609 [Abstract] [Full Text] [Related]
13. Enhanced electroluminescence from nanoscale silicon p+ -n junctions made with an anodic aluminum oxide pattern. Hong T, Chen T, Ran GZ, Wen J, Li YZ, Dai T, Qin GG. Nanotechnology; 2010 Jan 15; 21(2):025301. PubMed ID: 19955614 [Abstract] [Full Text] [Related]
14. Integrated circuits and logic operations based on single-layer MoS2. Radisavljevic B, Whitwick MB, Kis A. ACS Nano; 2011 Dec 27; 5(12):9934-8. PubMed ID: 22073905 [Abstract] [Full Text] [Related]
15. Co-integration of nano-scale vertical- and horizontal-channel metal-oxide-semiconductor field-effect transistors for low power CMOS technology. Sun MC, Kim G, Kim SW, Kim HW, Kim H, Lee JH, Shin H, Park BG. J Nanosci Nanotechnol; 2012 Jul 27; 12(7):5313-7. PubMed ID: 22966563 [Abstract] [Full Text] [Related]
16. Fabrication of ultrathin and highly uniform silicon on insulator by numerically controlled plasma chemical vaporization machining. Sano Y, Yamamura K, Mimura H, Yamauchi K, Mori Y. Rev Sci Instrum; 2007 Aug 27; 78(8):086102. PubMed ID: 17764362 [Abstract] [Full Text] [Related]
18. Quantum mechanical device modeling: FinFET having an isolated n+/p+ gate region strapped with poly-silicon. Kim HG, Kim JS, Kim YK, Won T. J Nanosci Nanotechnol; 2007 Nov 24; 7(11):4135-8. PubMed ID: 18047135 [Abstract] [Full Text] [Related]
19. Transport characteristics of multichannel transistors made from densely aligned sub-10 nm half-pitch graphene nanoribbons. Liang X, Wi S. ACS Nano; 2012 Nov 27; 6(11):9700-10. PubMed ID: 23078122 [Abstract] [Full Text] [Related]
20. Morphological impact of zinc oxide layers on the device performance in thin-film transistors. Faber H, Klaumünzer M, Voigt M, Galli D, Vieweg BF, Peukert W, Spiecker E, Halik M. Nanoscale; 2011 Mar 27; 3(3):897-9. PubMed ID: 21116548 [Abstract] [Full Text] [Related] Page: [Next] [New Search]