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Journal Abstract Search

196 related items for PubMed ID: 23030863

  • 21. Frequency noise in frequency modulation atomic force microscopy.
    Kobayashi K, Yamada H, Matsushige K.
    Rev Sci Instrum; 2009 Apr; 80(4):043708. PubMed ID: 19405667
    [Abstract] [Full Text] [Related]

  • 22. The noise of coated cantilevers.
    Labuda A, Bates JR, Grütter PH.
    Nanotechnology; 2012 Jan 20; 23(2):025503. PubMed ID: 22166345
    [Abstract] [Full Text] [Related]

  • 23. A modified multibond model for nanoscale static friction.
    Milne ZB, Hasz K, McClimon JB, Castro J, Carpick RW.
    Philos Trans A Math Phys Eng Sci; 2022 Sep 19; 380(2232):20210342. PubMed ID: 35909363
    [Abstract] [Full Text] [Related]

  • 24. Extraction of stochastic dynamics from time series.
    Petelczyc M, Żebrowski JJ, Gac JM.
    Phys Rev E Stat Nonlin Soft Matter Phys; 2012 Jul 19; 86(1 Pt 1):011114. PubMed ID: 23005375
    [Abstract] [Full Text] [Related]

  • 25. Noise in NC-AFM measurements with significant tip-sample interaction.
    Lübbe J, Temmen M, Rahe P, Reichling M.
    Beilstein J Nanotechnol; 2016 Jul 19; 7():1885-1904. PubMed ID: 28144538
    [Abstract] [Full Text] [Related]

  • 26. Quantitative measurement of friction between single microspheres by friction force microscopy.
    Ling X, Butt HJ, Kappl M.
    Langmuir; 2007 Jul 31; 23(16):8392-9. PubMed ID: 17622158
    [Abstract] [Full Text] [Related]

  • 27. Lateral force calibration: accurate procedures for colloidal probe friction measurements in atomic force microscopy.
    Chung KH, Pratt JR, Reitsma MG.
    Langmuir; 2010 Jan 19; 26(2):1386-94. PubMed ID: 19827782
    [Abstract] [Full Text] [Related]

  • 28. Improved parallel scan method for nanofriction force measurement with atomic force microscopy.
    Wang YL, Zhao XZ, Zhou FQ.
    Rev Sci Instrum; 2007 Mar 19; 78(3):036107. PubMed ID: 17411232
    [Abstract] [Full Text] [Related]

  • 29. Diffusive motion with nonlinear friction: apparently Brownian.
    Goohpattader PS, Chaudhury MK.
    J Chem Phys; 2010 Jul 14; 133(2):024702. PubMed ID: 20632765
    [Abstract] [Full Text] [Related]

  • 30. Stochastic switching of cantilever motion.
    Venstra WJ, Westra HJ, van der Zant HS.
    Nat Commun; 2013 Jul 14; 4():2624. PubMed ID: 24177274
    [Abstract] [Full Text] [Related]

  • 31. Boundary slip study on hydrophilic, hydrophobic, and superhydrophobic surfaces with dynamic atomic force microscopy.
    Bhushan B, Wang Y, Maali A.
    Langmuir; 2009 Jul 21; 25(14):8117-21. PubMed ID: 19402684
    [Abstract] [Full Text] [Related]

  • 32. Calibration of measurement sensitivities of multiple micro-cantilever dynamic modes in atomic force microscopy using a contact detection method.
    Liu Z, Jeong Y, Menq CH.
    Rev Sci Instrum; 2013 Feb 21; 84(2):023703. PubMed ID: 23464214
    [Abstract] [Full Text] [Related]

  • 33. Unbinding of the streptavidin-biotin complex by atomic force microscopy: a hybrid simulation study.
    Zhou J, Zhang L, Leng Y, Tsao HK, Sheng YJ, Jiang S.
    J Chem Phys; 2006 Sep 14; 125(10):104905. PubMed ID: 16999548
    [Abstract] [Full Text] [Related]

  • 34. Functionalized AFM probes for force spectroscopy: eigenmode shapes and stiffness calibration through thermal noise measurements.
    Laurent J, Steinberger A, Bellon L.
    Nanotechnology; 2013 Jun 07; 24(22):225504. PubMed ID: 23644764
    [Abstract] [Full Text] [Related]

  • 35. High-resolution noncontact atomic force microscopy.
    Pérez R, García R, Schwarz U.
    Nanotechnology; 2009 Jul 01; 20(26):260201. PubMed ID: 19531843
    [Abstract] [Full Text] [Related]

  • 36. Binding site models of friction due to the formation and rupture of bonds: state-function formalism, force-velocity relations, response to slip velocity transients, and slip stability.
    Srinivasan M, Walcott S.
    Phys Rev E Stat Nonlin Soft Matter Phys; 2009 Oct 01; 80(4 Pt 2):046124. PubMed ID: 19905407
    [Abstract] [Full Text] [Related]

  • 37. Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy.
    Kobayashi K, Yamada H, Matsushige K.
    Rev Sci Instrum; 2011 Mar 01; 82(3):033702. PubMed ID: 21456746
    [Abstract] [Full Text] [Related]

  • 38. Assessing micromechanical properties of cells with atomic force microscopy: importance of the contact point.
    Crick SL, Yin FC.
    Biomech Model Mechanobiol; 2007 Apr 01; 6(3):199-210. PubMed ID: 16775736
    [Abstract] [Full Text] [Related]

  • 39. Electric force microscopy of semiconductors: theory of cantilever frequency fluctuations and noncontact friction.
    Lekkala S, Marohn JA, Loring RF.
    J Chem Phys; 2013 Nov 14; 139(18):184702. PubMed ID: 24320286
    [Abstract] [Full Text] [Related]

  • 40. Spatial horizons in amplitude and frequency modulation atomic force microscopy.
    Font J, Santos S, Barcons V, Thomson NH, Verdaguer A, Chiesa M.
    Nanoscale; 2012 Apr 07; 4(7):2463-9. PubMed ID: 22374226
    [Abstract] [Full Text] [Related]

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