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Pubmed for Handhelds

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Journal Abstract Search

133 related items for PubMed ID: 23093809

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  • 4. The role of the cantilever in Kelvin probe force microscopy measurements.
    Elias G, Glatzel T, Meyer E, Schwarzman A, Boag A, Rosenwaks Y.
    Beilstein J Nanotechnol; 2011; 2():252-60. PubMed ID: 21977437
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  • 5. High-speed digitization of the amplitude and frequency in open-loop sideband frequency-modulation Kelvin probe force microscopy.
    Stan G.
    Nanotechnology; 2020 Jun 09; 31(38):385706. PubMed ID: 32516761
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  • 8. Pulsed Force Kelvin Probe Force Microscopy.
    Jakob DS, Wang H, Xu XG.
    ACS Nano; 2020 Apr 28; 14(4):4839-4848. PubMed ID: 32283008
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  • 9. Reconstruction of surface potential from Kelvin probe force microscopy images.
    Cohen G, Halpern E, Nanayakkara SU, Luther JM, Held C, Bennewitz R, Boag A, Rosenwaks Y.
    Nanotechnology; 2013 Jul 26; 24(29):295702. PubMed ID: 23807266
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  • 15. Three-Dimensional Kelvin Probe Force Microscopy.
    Geng J, Zhang H, Meng X, Gao H, Rong W, Xie H.
    ACS Appl Mater Interfaces; 2022 Jul 20; 14(28):32719-32728. PubMed ID: 35816692
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  • 16. Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping.
    Jakob DS, Li N, Zhou H, Xu XG.
    Small; 2021 Sep 20; 17(37):e2102495. PubMed ID: 34310045
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  • 17. Kelvin probe force microscopy in liquid using electrochemical force microscopy.
    Collins L, Jesse S, Kilpatrick JI, Tselev A, Okatan MB, Kalinin SV, Rodriguez BJ.
    Beilstein J Nanotechnol; 2015 Sep 20; 6():201-14. PubMed ID: 25671164
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  • 18. Multiparametric Kelvin Probe Force Microscopy for the Simultaneous Mapping of Surface Potential and Nanomechanical Properties.
    Xie H, Zhang H, Hussain D, Meng X, Song J, Sun L.
    Langmuir; 2017 Mar 21; 33(11):2725-2733. PubMed ID: 28263608
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  • 19. Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water.
    Kilpatrick JI, Kargin E, Rodriguez BJ.
    Beilstein J Nanotechnol; 2022 Mar 21; 13():922-943. PubMed ID: 36161252
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  • 20. Excluding Contact Electrification in Surface Potential Measurement Using Kelvin Probe Force Microscopy.
    Li S, Zhou Y, Zi Y, Zhang G, Wang ZL.
    ACS Nano; 2016 Feb 23; 10(2):2528-35. PubMed ID: 26824304
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