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Journal Abstract Search

412 related items for PubMed ID: 24758028

  • 1. Optical studies of pulsed laser deposited nanostructured Pb(Zr0.52Ti0.48)O3 thin film by spectroscopic ellipsometry.
    Prabu M, Banu IB, Sundari ST, Krishnan R, Chen YC, Chavali M.
    J Nanosci Nanotechnol; 2014 Jul; 14(7):5335-41. PubMed ID: 24758028
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  • 5. Ellipsometry Study of CdSe Thin Films Deposited by PLD on ITO Coated Glass Substrates.
    Inbanathan FPN, Kumar P, Dasari K, Katiyar RS, Chen J, Jadwisienczak WM.
    Materials (Basel); 2021 Jun 15; 14(12):. PubMed ID: 34203798
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  • 6. Thickness Dependence of Ferroelectric and Optical Properties in Pb(Zr0.53Ti0.47)O3 Thin Films.
    He J, Li F, Chen X, Qian S, Geng W, Bi K, Mu J, Hou X, Chou X.
    Sensors (Basel); 2019 Sep 20; 19(19):. PubMed ID: 31547156
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  • 7. Effect of carbon concentration on the optical properties of nanocrystalline diamond films deposited by hot-filament chemical vapor deposition method.
    Wang L, Liu J, Ren L, Su Q, Shi W, Xia Y.
    J Nanosci Nanotechnol; 2008 May 20; 8(5):2534-9. PubMed ID: 18572679
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  • 10. Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry.
    Jaiswal J, Mourya S, Malik G, Chauhan S, Sanger A, Daipuriya R, Singh M, Chandra R.
    Appl Opt; 2016 Oct 10; 55(29):8368-8375. PubMed ID: 27828089
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  • 11. Physical properties modulation of Fe₃O₄/Pb(ZrTi)O₃ heterostructure via Fe diffusion.
    Chichvarina O, Herng TS, Ding J.
    Nanotechnology; 2016 Mar 18; 27(11):115203. PubMed ID: 26875549
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  • 12. The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition.
    Wang ZY, Zhang RJ, Lu HL, Chen X, Sun Y, Zhang Y, Wei YF, Xu JP, Wang SY, Zheng YX, Chen LY.
    Nanoscale Res Lett; 2015 Mar 18; 10():46. PubMed ID: 25852343
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  • 14. Pulsed laser deposition and ferroelectric characterization of nanostructured perovskite lead zirconate titanate (52/48) thin films.
    Prabu M, Banu IB, Vijayaraghavan GV, Gobalakrishnan S, Chavali M.
    J Nanosci Nanotechnol; 2013 Mar 18; 13(3):1938-42. PubMed ID: 23755624
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  • 15. Determination of Optical Constants of Solgel-Derived Inhomogeneous TiO(2) Thin Films by Spectroscopic Ellipsometry and Transmission Spectroscopy.
    Mosaddeq-Ur-Rahman M, Yu G, Krishna KM, Soga T, Watanabe J, Jimbo T, Umeno M.
    Appl Opt; 1998 Feb 01; 37(4):691-7. PubMed ID: 18268642
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  • 16. Synthesis, Structural, Optical and Dielectric Properties of Nanostructured 0-3 PZT/PVDF Composite Films.
    Revathi S, Kennedy LJ, Basha SKK, Padmanabhan R.
    J Nanosci Nanotechnol; 2018 Jul 01; 18(7):4953-4962. PubMed ID: 29442679
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  • 17. Pulsed laser deposition with simultaneous in situ real-time monitoring of optical spectroscopic ellipsometry and reflection high-energy electron diffraction.
    Gruenewald JH, Nichols J, Seo SS.
    Rev Sci Instrum; 2013 Apr 01; 84(4):043902. PubMed ID: 23635204
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  • 20. Lanthanide-Assisted Deposition of Strongly Electro-optic PZT Thin Films on Silicon: Toward Integrated Active Nanophotonic Devices.
    George JP, Smet PF, Botterman J, Bliznuk V, Woestenborghs W, Van Thourhout D, Neyts K, Beeckman J.
    ACS Appl Mater Interfaces; 2015 Jun 24; 7(24):13350-9. PubMed ID: 26043103
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