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Journal Abstract Search

253 related items for PubMed ID: 25851168

  • 21. The importance of cantilever dynamics in the interpretation of Kelvin probe force microscopy.
    Satzinger KJ, Brown KA, Westervelt RM.
    J Appl Phys; 2012 Sep 15; 112(6):64510. PubMed ID: 23093809
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  • 22. On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex.
    Luchkin SY, Stevenson KJ.
    Microsc Microanal; 2018 Apr 15; 24(2):126-131. PubMed ID: 29618390
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  • 23. The influence of surface topography on Kelvin probe force microscopy.
    Sadewasser S, Leendertz C, Streicher F, Lux-Steiner MCh.
    Nanotechnology; 2009 Dec 16; 20(50):505503. PubMed ID: 19934483
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  • 29. Multiscale Functional Imaging of Interfaces through Atomic Force Microscopy Using Harmonic Mixing.
    Garrett JL, Leite MS, Munday JN.
    ACS Appl Mater Interfaces; 2018 Aug 29; 10(34):28850-28859. PubMed ID: 30113805
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  • 30. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2on SiO2.
    Arrighi A, Ullberg N, Derycke V, Grévin B.
    Nanotechnology; 2023 Mar 13; 34(21):. PubMed ID: 36812541
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  • 35. New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.
    Sadewasser S, Jelinek P, Fang CK, Custance O, Yamada Y, Sugimoto Y, Abe M, Morita S.
    Phys Rev Lett; 2009 Dec 31; 103(26):266103. PubMed ID: 20366324
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  • 36. Tip-to-sample distance dependence of an electrostatic force in KFM measurements.
    Takahashi T, Ono S.
    Ultramicroscopy; 2004 Aug 31; 100(3-4):287-92. PubMed ID: 15231321
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  • 37. Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices.
    Gysin U, Glatzel T, Schmölzer T, Schöner A, Reshanov S, Bartolf H, Meyer E.
    Beilstein J Nanotechnol; 2015 Aug 31; 6():2485-97. PubMed ID: 26885461
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