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Pubmed for Handhelds

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Journal Abstract Search

186 related items for PubMed ID: 26117434

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  • 4. Effective stiffness of qPlus sensor and quartz tuning fork.
    Kim J, Won D, Sung B, An S, Jhe W.
    Ultramicroscopy; 2014 Jun; 141():56-62. PubMed ID: 24727200
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  • 7. Stiffness calibration of qPlus sensors at low temperature through thermal noise measurements.
    Nony L, Clair S, Uehli D, Herrero A, Themlin JM, Campos A, Para F, Pioda A, Loppacher C.
    Beilstein J Nanotechnol; 2024 Jun; 15():580-602. PubMed ID: 38887532
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  • 10. Fundamental and higher eigenmodes of qPlus sensors with a long probe for vertical-lateral bimodal atomic force microscopy.
    Yamada Y, Ichii T, Utsunomiya T, Kimura K, Kobayashi K, Yamada H, Sugimura H.
    Nanoscale Adv; 2023 Jan 31; 5(3):840-850. PubMed ID: 36756504
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  • 11. Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.
    Sweetman A, Jarvis S, Danza R, Moriarty P.
    Beilstein J Nanotechnol; 2012 Jan 31; 3():25-32. PubMed ID: 22428093
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  • 12. Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis.
    Dagdeviren OE, Schwarz UD.
    Beilstein J Nanotechnol; 2017 Jan 31; 8():657-666. PubMed ID: 28462067
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  • 14. Electrochemical AFM/STM with a qPlus sensor: A versatile tool to study solid-liquid interfaces.
    Auer A, Eder B, Giessibl FJ.
    J Chem Phys; 2023 Nov 07; 159(17):. PubMed ID: 37909458
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  • 16. Dynamic Responses of Electrically Driven Quartz Tuning Fork and qPlus Sensor: A Comprehensive Electromechanical Model for Quartz Tuning Fork.
    Lee M, Kim B, An S, Jhe W.
    Sensors (Basel); 2019 Jun 14; 19(12):. PubMed ID: 31207882
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  • 18. A simple method for the determination of qPlus sensor spring constants.
    Melcher J, Stirling J, Shaw GA.
    Beilstein J Nanotechnol; 2015 Jun 14; 6():1733-42. PubMed ID: 26425425
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  • 19. Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor.
    Hussain D, Wen Y, Zhang H, Song J, Xie H.
    Sensors (Basel); 2018 Jan 01; 18(1):. PubMed ID: 29301265
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  • 20. Atomic force microscopy imaging using a tip-on-chip: opening the door to integrated near field nanotools.
    Hayton J, Polesel-Maris J, Demadrille R, Brun M, Thoyer F, Lubin C, Cousty J, Grévin B.
    Rev Sci Instrum; 2010 Sep 01; 81(9):093707. PubMed ID: 20886987
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