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Journal Abstract Search

288 related items for PubMed ID: 28110179

  • 1. Analysis the effect of different geometries of AFM's cantilever on the dynamic behavior and the critical forces of three-dimensional manipulation.
    Korayem MH, Saraie MB, Saraee MB.
    Ultramicroscopy; 2017 Apr; 175():9-24. PubMed ID: 28110179
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  • 2. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers.
    Yeh MK, Tai NH, Chen BY.
    Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729
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  • 3. Calibration of the spring constant of cantilevers of arbitrary shape using the phase signal in an atomic force microscope.
    Rawlings C, Durkan C.
    Nanotechnology; 2012 Dec 07; 23(48):485708. PubMed ID: 23137943
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  • 5. Effects of anisotropic material property on the spring constant and the resonant frequency of atomic force microscope cantilever.
    Yeh MK, Tai NH, Chen BY.
    Rev Sci Instrum; 2009 Apr 07; 80(4):043705. PubMed ID: 19405664
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  • 6. A New "Quasi-Dynamic" Method for Determining the Hamaker Constant of Solids Using an Atomic Force Microscope.
    Fronczak SG, Dong J, Browne CA, Krenek EC, Franses EI, Beaudoin SP, Corti DS.
    Langmuir; 2017 Jan 24; 33(3):714-725. PubMed ID: 28036189
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  • 7. Determination of calibration parameters of cantilevers of arbitrary shape by finite element analysis.
    Rodriguez-Ramos J, Rico F.
    Rev Sci Instrum; 2021 Apr 01; 92(4):045001. PubMed ID: 34243426
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  • 8. Accuracy of the spring constant of atomic force microscopy cantilevers by finite element method.
    Chen BY, Yeh MK, Tai NH.
    Anal Chem; 2007 Feb 15; 79(4):1333-8. PubMed ID: 17297931
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  • 11. Accurate spring constant calibration for very stiff atomic force microscopy cantilevers.
    Grutzik SJ, Gates RS, Gerbig YB, Smith DT, Cook RF, Zehnder AT.
    Rev Sci Instrum; 2013 Nov 15; 84(11):113706. PubMed ID: 24289403
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  • 12. Effect of cantilevers' dimensions on phase contrast in multifrequency atomic force microscopy.
    Ehsanipour M, Damircheli M, Eslami B.
    Microsc Res Tech; 2019 Sep 15; 82(9):1438-1447. PubMed ID: 31106947
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  • 13. In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude.
    de Laat ML, Pérez Garza HH, Ghatkesar MK.
    Sensors (Basel); 2016 Apr 12; 16(4):. PubMed ID: 27077863
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  • 15. Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode.
    Biczysko P, Dzierka A, Jóźwiak G, Rudek M, Gotszalk T, Janus P, Grabiec P, Rangelow IW.
    Ultramicroscopy; 2018 Jan 12; 184(Pt A):199-208. PubMed ID: 28950210
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  • 16. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
    Slattery AD, Blanch AJ, Quinton JS, Gibson CT.
    Ultramicroscopy; 2013 Aug 12; 131():46-55. PubMed ID: 23685172
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  • 17. Neural network sliding mode controller of atomic force microscope-based manipulation with different cantilever probes.
    Korayem MH, Esmaeilzadehha S.
    Microsc Res Tech; 2019 Jul 12; 82(7):993-1003. PubMed ID: 30839142
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  • 18. Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor.
    Xie H, Vitard J, Haliyo S, Régnier S, Boukallel M.
    Rev Sci Instrum; 2008 Mar 12; 79(3):033708. PubMed ID: 18377016
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