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Pubmed for Handhelds

PUBMED FOR HANDHELDS

Journal Abstract Search

320 related items for PubMed ID: 29301265

  • 1. Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor.
    Hussain D, Wen Y, Zhang H, Song J, Xie H.
    Sensors (Basel); 2018 Jan 01; 18(1):. PubMed ID: 29301265
    [Abstract] [Full Text] [Related]

  • 2. Mechanically stable tuning fork sensor with high quality factor for the atomic force microscope.
    Kim K, Park JY, Kim KB, Lee N, Seo Y.
    Scanning; 2014 Jan 01; 36(6):632-9. PubMed ID: 25229367
    [Abstract] [Full Text] [Related]

  • 3. The qPlus sensor, a powerful core for the atomic force microscope.
    Giessibl FJ.
    Rev Sci Instrum; 2019 Jan 01; 90(1):011101. PubMed ID: 30709191
    [Abstract] [Full Text] [Related]

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  • 5. Atomic force microscopy deep trench and sidewall imaging with an optical fiber probe.
    Xie H, Hussain D, Yang F, Sun L.
    Rev Sci Instrum; 2014 Dec 01; 85(12):123704. PubMed ID: 25554298
    [Abstract] [Full Text] [Related]

  • 6. Atomic force microscope caliper for critical dimension measurements of micro and nanostructures through sidewall scanning.
    Xie H, Hussain D, Yang F, Sun L.
    Ultramicroscopy; 2015 Nov 01; 158():8-16. PubMed ID: 26103045
    [Abstract] [Full Text] [Related]

  • 7. Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication.
    An S, Lee K, Kim B, Noh H, Kim J, Kwon S, Lee M, Hong MH, Jhe W.
    Rev Sci Instrum; 2014 Mar 01; 85(3):033702. PubMed ID: 24689587
    [Abstract] [Full Text] [Related]

  • 8. Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor.
    Jahng J, Kwon H, Lee ES.
    Sensors (Basel); 2019 Mar 29; 19(7):. PubMed ID: 30934843
    [Abstract] [Full Text] [Related]

  • 9. Application of focused ion-beam sampling for sidewall-roughness measurement of free-standing sub-μm objects by atomic force microscopy.
    Nagatomi T, Nakao T, Fujimoto Y.
    Microscopy (Oxf); 2020 Mar 09; 69(1):11-16. PubMed ID: 31943021
    [Abstract] [Full Text] [Related]

  • 10. Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe.
    Luo Y, Ding X, Chen T, Su T, Chen D.
    Micromachines (Basel); 2023 Jan 15; 14(1):. PubMed ID: 36677289
    [Abstract] [Full Text] [Related]

  • 11. Effective stiffness of qPlus sensor and quartz tuning fork.
    Kim J, Won D, Sung B, An S, Jhe W.
    Ultramicroscopy; 2014 Jun 15; 141():56-62. PubMed ID: 24727200
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  • 13. Three-Dimensional Atomic Force Microscopy for Sidewall Imaging Using Torsional Resonance Mode.
    Liu L, Xu J, Zhang R, Wu S, Hu X, Hu X.
    Scanning; 2018 Jun 15; 2018():7606037. PubMed ID: 30116468
    [Abstract] [Full Text] [Related]

  • 14. Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments.
    Oiko VT, Martins BV, Silva PC, Rodrigues V, Ugarte D.
    Rev Sci Instrum; 2014 Mar 15; 85(3):035003. PubMed ID: 24689612
    [Abstract] [Full Text] [Related]

  • 15. Three-dimensional imaging of undercut and sidewall structures by atomic force microscopy.
    Cho SJ, Ahn BW, Kim J, Lee JM, Hua Y, Yoo YK, Park SI.
    Rev Sci Instrum; 2011 Feb 15; 82(2):023707. PubMed ID: 21361601
    [Abstract] [Full Text] [Related]

  • 16. Equivalent Electromechanical Model for Quartz Tuning Fork Used in Atomic Force Microscopy.
    Lin R, Qian J, Li Y, Cheng P, Wang C, Li L, Gao X, Sun W.
    Sensors (Basel); 2023 Apr 12; 23(8):. PubMed ID: 37112263
    [Abstract] [Full Text] [Related]

  • 17. Nanopipette/Nanorod-Combined Quartz Tuning Fork⁻Atomic Force Microscope.
    An S, Jhe W.
    Sensors (Basel); 2019 Apr 15; 19(8):. PubMed ID: 30991660
    [Abstract] [Full Text] [Related]

  • 18. Fundamental and higher eigenmodes of qPlus sensors with a long probe for vertical-lateral bimodal atomic force microscopy.
    Yamada Y, Ichii T, Utsunomiya T, Kimura K, Kobayashi K, Yamada H, Sugimura H.
    Nanoscale Adv; 2023 Jan 31; 5(3):840-850. PubMed ID: 36756504
    [Abstract] [Full Text] [Related]

  • 19. Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt control.
    Fairbairn M, Moheimani SO.
    Rev Sci Instrum; 2013 May 31; 84(5):053706. PubMed ID: 23742557
    [Abstract] [Full Text] [Related]

  • 20. New fabrication technique for highly sensitive qPlus sensor with well-defined spring constant.
    Labidi H, Kupsta M, Huff T, Salomons M, Vick D, Taucer M, Pitters J, Wolkow RA.
    Ultramicroscopy; 2015 Nov 31; 158():33-7. PubMed ID: 26117434
    [Abstract] [Full Text] [Related]

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