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Pubmed for Handhelds

PUBMED FOR HANDHELDS

Journal Abstract Search

122 related items for PubMed ID: 30116468

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    Grobelny J, DelRio FW, Pradeep N, Kim DI, Hackley VA, Cook RF.
    ; 2005 05 01. PubMed ID: 39013048
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  • 6. Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever.
    Kawagishi T, Kato A, Hoshi Y, Kawakatsu H.
    Ultramicroscopy; 2002 May 01; 91(1-4):37-48. PubMed ID: 12211482
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  • 9. Three-Dimensional Kelvin Probe Force Microscopy.
    Geng J, Zhang H, Meng X, Gao H, Rong W, Xie H.
    ACS Appl Mater Interfaces; 2022 Jul 20; 14(28):32719-32728. PubMed ID: 35816692
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  • 10. A torsional resonance mode AFM for in-plane tip surface interactions.
    Huang L, Su C.
    Ultramicroscopy; 2004 Aug 20; 100(3-4):277-85. PubMed ID: 15231320
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  • 12. A 3D surface nanomechanical property mapping method with a magnetic-drive orthogonal cantilever probe.
    Geng J, Zhang H, Meng X, Xie H.
    Nanoscale; 2023 Jul 20; 15(28):11990-11999. PubMed ID: 37401547
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  • 13. Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface.
    Yurtsever A, Gigler AM, Stark RW.
    Ultramicroscopy; 2009 Feb 20; 109(3):275-9. PubMed ID: 19131169
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  • 16. High-resolution noncontact atomic force microscopy.
    Pérez R, García R, Schwarz U.
    Nanotechnology; 2009 Jul 01; 20(26):260201. PubMed ID: 19531843
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  • 17. Quartz tuning fork based three-dimensional topography imaging for sidewall with blind features.
    Akhtar I, Rehman MA, Choi W, Bae J, Seo Y.
    Ultramicroscopy; 2020 Mar 01; 210():112916. PubMed ID: 31816542
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  • 20. Automated measurement and analysis of sidewall roughness using three-dimensional atomic force microscopy.
    Yoo SB, Yun SH, Jo AJ, Cho SJ, Cho H, Lee JH, Ahn BW.
    Appl Microsc; 2022 Mar 08; 52(1):1. PubMed ID: 35258764
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