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10. Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes--an introduction of valence electron spectroscopy for transmission electron microscopy. Terauchi M, Koike M, Fukushima K, Kimura A. J Electron Microsc (Tokyo); 2010 Jun; 59(4):251-61. PubMed ID: 20371492 [Abstract] [Full Text] [Related]
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