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5. X-ray microanalysis of organic thin sections in TEM using an UTW Si(Li) detector: comparison of quantification methods. Laquerriere P, Banchet V, Michel J, Zierold K, Balossier G, Bonhomme P. Microsc Res Tech; 2001 Jan 15; 52(2):231-8. PubMed ID: 11169870 [Abstract] [Full Text] [Related]
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